J OURNAL of
I NTEGRATED
CIRCUITS and
SYSTEMS
Volume 1
Number 3
July 2006
ISSN 1807-1953
BRAZILIAN
COMPUTER
SOCIETY
The Journal of Integrated Circuits and Systems (JICS) has four issues in each volume. This issue
was published by the SBMicro – The Brazilian Microelectronics Society and the SBC - The Brazilian
Computer Society (Sociedade Brasileira de Computação) non-profit organizations whose goals include
fostering microelectronics and computer science teaching, research and development, as well as
promoting, through meetings, conferences and publications, the dissemination of scientific knowledge
and the interests of the microelectronics and computer science community in Brazil.
Editor-in-Chief:
Ricardo Reis, Universidade Federal do Rio Grande do Sul, Brazil
Co-Editors:
Pascal Fouillat (U. Bordeaux, France)
Fernando Moraes (PUCRS, Brazil)
Associate Editors:
Process and Materials
Jacobus Swart (UNICAMP - Brazil)
Olivier Bonnaud (Univ.Rennes – France)
Device and Characterization
João Antonio Martino (USP - Brazil)
Cor Clayes (IMEC - Belgium)
Design
Armando Gomes (Motorola - Brazil)
Franco Maloberti (Texas A&M - USA)
Test
Vladimir Castro Alves (Morphotec- USA)
Yervant Zorian (Logic Vision - USA)
CAD
Reinaldo Bergamaschi (IBM - USA)
Ahmed Jerraya (TIMA - France)
Copyright Notice
Permission to copy without fee all or part of the material printed in JICS is granted provided that the
copies are not made or distributed for commercial advantage, and that notice is given that copying is
by permission of the Brazilian Microelectronics Society or the Brazilian Computer Society.
Sociedade Brasileira de Computação
Sociedade Brasileira de Microeletrônica
Av. Bento Goncalves, 9500 - Porto Alegre – Brazil
Caixa Postal 15012 - CEP 91501-970
Phone: 51 33166835 - Fax: 51 33167142
Av. Prof. Luciano Gualberto, 158 - Trav. 3 – E.Eletrica USP
São Paulo - SP / CEP 05508-900
Phone: +55 (11) 3091 5658 / 5270
J OURNAL of
I NTEGRATED
C IRCUITS and
S YSTEMS
Volume 1
Number 3
July 2006
ISSN 1807-1953
CONTENTS:
Letter from the Editors
3
Articles:
Noise and Fluctuations in Deep-Sub-Micron MOSFETs
G. Wirth, R. da Silva, J. Koh, R. Thewes, R. Brederlow
5
Evaluation of SRAMs Reliability for Space Electronics Using Ultra Short Laser Pulses
F. Darracq, H. Lapuyade, P. Fouillat, V. Pouget, D. Lewis, Y. Danto
11
Radiation-tolerant CMOS APS Arrays
V. da Silva, L. Dornelles, P. Canazio, F. dos Santos, A. Mesquita, M. V. da Silva
17
Electrical Characterization of Graded-Channel SOI Gate-All-Around nMOSFET
up to 300°C
C. dos Santos, M. Pavanello, J. Martino, D. Flandre, J.-P. Raskin
Simulation and Test Structure of a Micro-Electromechanical CMOS
Pressure Sensor
F. Fruett, V. Garcia, I. Gentini, R. Pavanello
23
29
Single-electron Winner-take-all Macro Block for Large-Scale Integrated Neural
Networks
J. G. Guimarães, L. M. Nóbrega and J. C. da Costa
34
Self-Assembled Polystyrene Micro-Spheres Applied for Photonic Crystals and
Templates Fabrication
D. S. Raimundo, F. J. R. Fernandez, W. J. Salcedo
39
Polymeric Corrugated Membranes of PMMA Fabricated by Micro-Casting
Technique for MOEMS and Optical Applications
E. Y. Arashiro, M. N. P. Carreño
44
Analysis of Electrospinning of Nanofibers as a Function of Polyacrylonitrile (PAN)
Concentration
R. D. Martinez, A. N. R. da Silva, R. Furlan, I. Ramos, J. J. Santiago-Avile!s
48
The Influence of the AC Component of the Plasma Potential on the
Measurement of the Ion Flux
L. Swart, P. Verdonck
52
Letter From the Editors
The Editorial Board has the satisfaction to launch the third
edition of the Journal of Integrated Circuits and Systems JICS. It is an effort of both Brazilian Microelectronics
Society - SBMicro and Brazilian Computer Society - SBC
to create a new scientific journal covering the following
microelectronic domains: Process and Materials, Device
and Characterization, Design, Test and CAD of Integrated
Circuits and Systems.
Each volume of the Journal of Integrated Circuits and
Systems has four issues, through special issues on subjects
to be defined by the Editorial Board.
This third edition includes extended and updated versions
of selected papers from the SBMicro2004. We would like
to thanks Edval Santos that has worked as an invited editor
for the papers of this edition.
We ask the researches all around the world to submit good
papers to consolidate the journal as an international
publication composed by a set of attractive and outstanding
papers.
The editors


CEITEC, Center of Excellence in
Advanced Electronics Technology, is an
ambitious project intending to develop a core
competence in microelectronics. The objective
is to introduce Brazil in the global IC market
creating an attractive environment for national
and international investments and providing
new opportunities for Brazilian companies.
CEITEC consists of two units: a
foundry for low volume production and
prototyping and a design center. These two
units are complementary and together intend to
develop the Brazilian microelectronic sector.
CEITEC´s Design Center belongs to
the IC Brazil Program, a strategic program
from the Ministry of Science and Technology.
The purpose of the program is to help the
semiconductor segment to achieve a consistent
position in the global market. Note that the IC
Brazil Program is part of the Brazilian
Microelectronics Program, which aims at
microelectronics education and development.
The Brazilian design centers will provide jobs
for the participants of the educational program.
In this context CEITEC´s design
center, working currently at PUCRS and
UFRGS - two important universities in Porto
Alegre, offers state-of-the-art design services
for companies improving the competitiveness
of national electronic based products through
the possibility of designing application specific
circuits in our country. The Centre provides
expertise, infrastructure and a team able to
work at all phases of chip design. CEITEC’s
team, composed of 15 engineers and planning
to grow to 60 in 2007, consists of full-time
professionals focused in analog or digital
design with the goal of using their expertise to
solve specific problems for the customers. The
designers are specialized at different functions
including design entry and analysis, technology
optimization, design verification, test insertion,
synthesis and layout, and use well defined and
documented processes. The projects are
implemented under a clear project management
strategy in an automated environment using
configuration management to guarantee
operational efficiency and schedule matching.
CEITEC is able to offer a complete
service (human resources and infrastructure
composed of state-of-the-art equipments and
software) to companies assuming all or part of
their circuit designs. Moreover the centre can
also be responsible for follow-up on the various
stages of manufacturing, f. ex. coordination
with the foundry, and packaging, testing
companies.
CEITEC’s engineers can help a
customer to identify the best solution for each
case and to analyze the commercial viability of
an idea, looking for the adequate technology.
Besides this, CEITEC propagates
knowledge and methods in design and
manufacturing of semiconductors devices
through an internship program for students of
the universities and provides an environment
for entrepreneurship in IC business with a
focus on microelectronic projects and products.
www.ceitec.org.br
Instructions for authors and editorial policy
JICS is a formal publication of both the Brazilian Computer Society and the
Brazilian Microelectronics Society. Its aim is to publish original research papers,
serving as an environment for stimulating and disseminating research in all fields
of microelectronics. Both theoretical and experimental papers are welcome.
Contributions will be considered for publication in JICS if they have not to been
published previously (except in the form of an abstract or thesis) and are not under
consideration for publication elsewhere. Acceptance of papers for publication is
subject to a peer review procedure and is conditional on revisions being mode
given comments from referees. Details of format for final submission will be
provided for accepted papers. An electronic format of the final version will be
required, authors need to provide source files and a pdf one. Authors whose
papers are accepted will be requested to transfer the copyright rights to the
Brazilian Computer Society and the Brazilian Microelectronics Society, to ensure
the widest possible dissemination of the paper. It is the sole responsibility of the
authors to obtain the necessary permissions to cite other source. The authors are
also responsible for the correctness of the information contained in the paper.
Submitted articles are to be written in English and type double spaced on one side
of white A4 sized paper, using the template available ate journal website. Each
paper should be no more than 20 pages long, including all text, figures and
references. The final manuscript should be approximately 8,000 words in length.
Page one should contain the article title (not more than 15words), author(s),
affiliation(s), keywords (up to 6 keywords), and the name, fax number and
complete mailing address (both postal and email) for the person to whom
correspondence should be sent, as well as a short abstract. All contributions will
be acknowledged and referred. To speed up electronic editing of accepted papers,
authors should look at the JICS website, and also keep in mind the following rules.
Illustrations may have to be resized to fit the text. Therefore, figures must be in
black and white to avoid loss of sharpness, and should be preferably drawn using
a vector-style editor and not a bitmap editor. All lettering in a figure should be large
enough to permit legibility after editing. Captions should not be included in the
figures, to avoid conflicts with the final typeset captions. If a figure is essentially
composed of text (e. g., a table) then it should not be drawn, but typed inside the
main text.
Please submit a digital copy of your paper using the journal website. If you have
any question, please contact the editors.
J OURNAL of
I NTEGRATED
C IRCUITS and
S YSTEMS
C ontents
Noise and Fluctuations in Deep-Sub-Micron MOSFETs
G. Wirth, R. da Silva, J. Koh, R. Thewes, R. Brederlow
Evaluation of SRAMs Reliability for Space Electronics Using Ultra Short Laser Pulses
F. Darracq, H. Lapuyade, P. Fouillat, V. Pouget, D. Lewis, Y. Danto
Radiation-tolerant CMOS APS Arrays
V. da Silva, L. Dornelles, P. Canazio, F. dos Santos, A. Mesquita, M. V. da Silva
Electrical Characterization of Graded-Channel SOI Gate-All-Around nMOSFET up to 300°C
C. dos Santos, M. Pavanello, J. Martino, D. Flandre, J.-P. Raskin
Simulation and Test Structure of a Micro-Electromechanical CMOS
Pressure Sensor
F. Fruett, V. Garcia, I. Gentini, R. Pavanello
Single-electron Winner-take-all Macro Block for Large-Scale Integrated Neural Networks
J. G. Guimarães, L. M. Nóbrega and J. C. da Costa
Self-Assembled Polystyrene Micro-Spheres Applied for Photonic Crystals and
Templates Fabrication
D. S. Raimundo, F. J. R. Fernandez, W. J. Salcedo
Polymeric Corrugated Membranes of PMMA Fabricated by Micro-Casting
Technique for MOEMS and Optical Applications
E. Y. Arashiro, M. N. P. Carreño
Analysis of Electrospinning of Nanofibers as a Function of Polyacrylonitrile (PAN)
Concentration
R. D. Martinez, A. N. R. da Silva, R. Furlan, I. Ramos, J. J. Santiago-Avilés
The Influence of the AC Component of the Plasma Potential on the Measurement
of the Ion Flux
L. Swart, P. Verdonck
www.sbc.org.br/jics
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